M&M 2016 X43 Diffraction Mapping and 4D STEM from nanobeam Watch Video
Preview(s): Play Video: (Note: The default playback of the video is HD VERSION. If your browser is buffering the video slowly, please play the REGULAR MP4 VERSION or Open The Video below for better experience. Thank you!)
Your browser does not support playing the video.Please download the video!
⏲ Duration: 42 min 43 sec ✓ Published: 12-Jan-2019
Description: Speaker: Christopher Gammernn- Recent developments in fast electron detectors enable recording maps of diffraction patterns during STEM acquisitionn- The recorded dataset allows reconstruction of virtual diffraction patterns from arbitrarily small regions or virtual dark-field images with specifically designed aperturesn- Strain mapping using nanobeam electron diffraction combines nanometer resolution with a high precision and a very large field of view